Characteristics of chromium nitride thin-film strain gauges

Sensors and Materials

Volumn 13, Issue 1, 2001, Pages 13-23

  Chung, Gwiy Sang ^b   Lee, Won Jae ^a   Song, Jae Sung ^a  

^a Korea Electrotechnology Research Institute (KERI)   (South Korea)

^b Dongseo University   (South Korea)

Author keywords

Aging effect; Chromium nitride; Gauge factor; Hysteresis; I V T curve; Strain gauge; Temperature coefficient of resistance; Thin film

Indexed keywords

EID: 0035649470     PISSN: 09144935     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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