Oscillatory phase behaviour as a function of film thickness due to confinement in fcc (100) A3-B alloy thin films

Chinese Physics Letters

Volumn 18, Issue 11, 2001, Pages 1504-1506

  Ni, Jun ^a   Liu, Hua ^a   Gu, Bing Lin ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ORDER DISORDER TRANSITIONS; SURFACE SEGREGATION;

ALLOY THIN FILMS; FILM-THICKNESS; MEAN FIELD METHODS; ORDER/DISORDER PHASE TRANSITION; ORDERED PHASIS; SPATIAL VARIATIONS; THIN-FILMS;

THIN FILMS;

EID: 0035647852     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/18/11/325     Document Type: Article

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