Characterisation of optical properties in micro-patterned InGaN quantum wells

Physica Status Solidi (B) Basic Research

Volumn 228, Issue 1, 2001, Pages 169-172

  Kim, K S ^a   Edwards, P R ^a   Kim, H S ^a   Martin, R W ^a   Watson, I M ^a   Dawson, M D ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035647812     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200111)228:1<169::AID-PSSB169>3.0.CO;2-7     Document Type: Article

References (5)

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2. S.L. MCCALL, A.F.J. LEVI, R.E. SLUSHER, S.J. PEARTON, and R.A. LOGAN, Appl. Phys. Lett. 60, 289 (1992).
3. K.C. ZENG, L. DAI, J.Y. LIN, and H.X. JIANG, Appl. Phys. Lett. 75, 2563 (1999).
4. R. PECHARROMAN-GALLEGO, P.R. EDWARDS, R.W. MARTIN, and I.M. WATSON, Proc. E-MRS Spring 2001 Meeting, submitted.
5. E. EJDER, phys. stat. sol. (a) 6, 445 (1977).