Influence of plasma resistance and fluctuation on probe characteristics in detached recombining plasmas

Contributions to Plasma Physics

Volumn 41, Issue 5, 2001, Pages 473-480

  Ohno, N ^a   Tanaka, N ^a   Ezumi, N ^b   Nishijima, D ^a   Takamura, S ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b NAGANO NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TEMPERATURE; LANGMUIR PROBES; PLASMA SHEATHS;

CURRENT-VOLTAGE CHARACTERISTICS; DIVERTOR PLASMA; MAGNETIC FIELD FLUCTUATIONS; NAGDIS-II; PLASMA FLUCTUATIONS; PLASMA RESISTANCE; PLASMA SIMULATORS; POTENTIAL FLUCTUATIONS; PROBE CHARACTERISTICS; RECOMBINING PLASMAS;

PLASMA DENSITY;

EID: 0035641237     PISSN: 08631042     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3986(200109)41:5<473::AID-CTPP473>3.0.CO;2-8     Document Type: Article

References (8)

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