X-ray waveguide phenomenon in thin layers under grazing incidence conditions

X-Ray Spectrometry

Volumn 30, Issue 3, 2001, Pages 180-185

  Ebel, Horst ^a   Svagera, Robert ^a   Ebel, Maria F ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

REFRACTION; WAVEGUIDES;

CONDITION; GRAZING INCIDENCE; PHOTON ENERGY; PURE SILICON; SNELL LAW; TAKE-OFF ANGLE; THIN LAYERS; THIN-FILMS; X-RAY REFRACTION; X-RAY WAVEGUIDES;

SILICON WAFERS;

EID: 0035632235     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.485     Document Type: Article

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