Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry

X-Ray Spectrometry

Volumn 30, Issue 5, 2001, Pages 320-329

  Van Malderen, ^a   Hoornaert, S ^a   Injuk, J ^a   Przybylowicz, W J ^b,c   Pineda, C A ^b,d   Prozesky, V M ^b   Van Grieken, R ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b NATIONAL ACCELERATOR CENTRE   (South Africa)

^c AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^d UNIVERSITY OF CAPE TOWN   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSOLS; CLUSTER ANALYSIS; ELECTRON PROBE MICROANALYSIS; HEAVY METALS; HIERARCHICAL SYSTEMS; MAPPING;

AEROSOL SAMPLES; BACKSCATTERING SPECTROMETRY; COMPLEX PARTICLES; HIERARCHICAL CLUSTER ANALYSIS; INDIVIDUAL PARTICLE ANALYSIS; INDIVIDUAL PARTICLES; MICRO-PIXE; PARTICLE CHARACTERIZATION; SIBERIA; X-RAY MAPPING;

BACKSCATTERING;

EID: 0035628559     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.505     Document Type: Article

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