The impact of instrument engineering parameters on spectral reproducibility across filter instruments

Journal of Near Infrared Spectroscopy

Volumn 9, Issue 2, 2001, Pages 97-105

  Siska, Juraj J ^a   Hurburgh, Charles R ^a   Siska, Peter P ^a,b  

^a IOWA STATE UNIVERSITY   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Engineering parameters; Near infrared spectroscopy; Standardisation

Indexed keywords

BANDPASS FILTERS; INFRARED DEVICES; NEAR INFRARED SPECTROSCOPY;

CLASSIFIEDS; ENGINEERING PARAMETERS; FILTER BANDWIDTH; FILTER INSTRUMENTS; FILTER WHEEL; INFLUENCE ANALYSIS; MASTER SLAVE; MEAN-SQUARE; OPTICAL-; REPRODUCIBILITIES;

STANDARDIZATION;

EID: 0035622535     PISSN: 09670335     EISSN: None     Source Type: Journal    
DOI: 10.1255/jnirs.296     Document Type: Article

References (12)

1. J.S. Shenk and M.O. Westerhaus, Crop Sci. 31, 1694 (1991).
2. J.S. Shenk and M.O. Westerhaus, NIR news 5, 13 (1993).
3. J.S. Shenk and M.O. Westerhaus, US Patent No. 4866644 (1989).
4. Y. Wang, D.J. Veltkamp and B.R. Kowalski, Anal. Chem. 63, 2750 (1991).
5. Y. Wang, T. Dean and B.R. Kowalski, Anal. Chem. 67, 2379 (1995).
6. I.S. Adhihetty, J. McGuire, B. Wangmaneerat and T.M. Niemczyk, Anal. Chem. 63, 2329 (1991).
7. Q. Wang, S.D. DeJesus, J.P. Conzen, A. Schmidt and H. Weiler, J. Near Infrared Spectrosc. 6, A201 (1998).
8. Monolight optical spectrum analyser, Macam Photometrics Ltd, West Lothian, UK.
9. J. Siska, C.R. Hurburgh, Jr and P.P. Siska, submitted to J. Near Infrared Spectrosc. 9, 107 (2001).
10. W.H. Press, S.A. Teukolsky, W.T. Vetterling and B.P. Flannery, Numerical Recipes in C. Cambridge University Press, Cambridge (1992).
11. Borland C++ 5.02, Borland International Inc., Scotts Valley, CA, USA (1997).
12. GigaSoft 2.1, Gigasoft Inc., Keller (1997).