|
Volumn 70, Issue 10, 2001, Pages 2817-2820
|
In-situ low-temperature transmission electron microscopy of the structural phase transitions in a thiospinel CuIr2S4 compound
|
Author keywords
CuIr2S4; Electron diffraction; In situ low temperature transmission electron microscopy; Structural phase transition
|
Indexed keywords
|
EID: 0035620353
PISSN: 00319015
EISSN: None
Source Type: Journal
DOI: 10.1143/JPSJ.70.2817 Document Type: Article |
Times cited : (27)
|
References (12)
|