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Volumn 18, Issue 4, 2001, Pages 525-527
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Enhancement in energy loss of MeV silicon clusters in C films
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CARBON FILMS;
IONS;
PROJECTILES;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SILICON;
C FILMS;
CARBON TARGETS;
CLUSTER EFFECTS;
EFFECTIVE THICKNESS;
ENERGY;
EXPERIMENTAL SET UP;
RUTHERFORD BACKSCATTERING TECHNIQUES;
SI IONS;
SILICON CLUSTERS;
THIN CARBON FILMS;
ENERGY DISSIPATION;
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EID: 0035609118
PISSN: 0256307X
EISSN: None
Source Type: Journal
DOI: 10.1088/0256-307X/18/4/319 Document Type: Article |
Times cited : (3)
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References (7)
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