Elemental mapping using proton-induced x-rays

X-Ray Spectrometry

Volumn 30, Issue 3, 2001, Pages 156-163

  Przybylowicz W J ^a,f   Mesjasz Przybylowicz J ^a   Pineda, C A ^a,b   Churms, C L ^a   Ryan, C G ^c   Prozesky, V M ^a   Frei, R ^d   Slabbert, J P ^a   Padayachee, J ^a   Reimold, W U ^e  

^a NATIONAL ACCELERATOR CENTRE   (South Africa)

^b UNIVERSITY OF CAPE TOWN   (South Africa)

^c CSIRO   (Australia)

^d UNIVERSITY OF COPENHAGEN   (Denmark)

^e UNIVERSITY OF THE WITWATERSRAND   (South Africa)

^f AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM SCANNING CAPABILITIES; DATA TREATMENT; ELEMENTAL CONCENTRATIONS; ELEMENTAL DISTRIBUTION; ELEMENTAL MAPPING; MICRO-ANALYTICAL TECHNIQUES; NUCLEAR MICROPROBES; PARTICLE INDUCED X-RAY EMISSION; SPATIAL RESOLUTION; TWO-DIMENSIONAL;

ION BEAMS;

EID: 0035591626     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.474     Document Type: Article

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