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Volumn 224, Issue 1, 2001, Pages 85-88

A carrier escape study from InAs self-assembled quantum dots by photocurrent measurement

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EID: 0035585306 PISSN: 03701972 EISSN: None Source Type: Journal
DOI: 10.1002/1521-3951(200103)224:1<85::AID-PSSB85>3.0.CO;2-X Document Type: Article

Times cited : (8)

References (11)

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