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Volumn 21, Issue 16, 2001, Pages 2931-2936
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Preparation, microstructure and microwave dielectric properties of ZrxTi1-xO4 (x=0.40-0.60) ceramics
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Author keywords
(Zr,Ti)2O4; Dielectric properties; Microwave dielectrics; Sintering
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL STRUCTURE;
DIELECTRIC PROPERTIES OF SOLIDS;
ENERGY DISPERSIVE SPECTROSCOPY;
GRAIN GROWTH;
MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
SINTERING;
SOLID SOLUTIONS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
ZIRCONIUM COMPOUNDS;
OPTIMUM SINTERING TEMPERATURE;
CERAMIC MATERIALS;
CERAMICS;
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EID: 0035577154
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/S0955-2219(01)00226-6 Document Type: Article |
Times cited : (20)
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References (27)
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