Heat capacity of silicon in the range 350-770 K

Scandinavian Journal of Metallurgy

Volumn 30, Issue 6, 2001, Pages 388-390

  Glazov, V M ^a   Pashinkin, A S ^a   Mikhailova, M S ^a  

^a NATIONAL RESEARCH UNIVERSITY OF ELECTRONIC TECHNOLOGY   (Russian Federation)

Author keywords

shaped curve; Heat capacity; Silicon; Structural transformation

Indexed keywords

ANISOTROPY; DIFFERENTIAL SCANNING CALORIMETRY; HEATING; MEASUREMENT ERRORS; PHASE TRANSITIONS; SINGLE CRYSTALS; SPECIFIC HEAT OF SOLIDS; THERMAL EFFECTS; THERMAL EXPANSION;

STRUCTURAL TRANSFORMATIONS;

SEMICONDUCTING SILICON;

EID: 0035575731     PISSN: 03710459     EISSN: None     Source Type: Journal    
DOI: 10.1034/j.1600-0692.2001.300606.x     Document Type: Article

References (11)

1. Strukturnye defekty v monokristallakh poluprovodnikov
2. Fazovye diagrammy elementov pri vysokhom davlenii