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Volumn 50, Issue 6, 2001, Pages 541-544

High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

(5) Liu, Junliang a Takeguchi, Masaki a Tanaka, Miyoko a Yasuda, Hidehiro a Furuya, Kazuo a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

Author keywords

High index surface; Reconstruction; Silicon; UHV HRTEM

Indexed keywords

CONFERENCE PAPER;

SCANNING TUNNELING MICROSCOPY; SILICON;

CROSS-SECTIONAL STRUCTURES; HIGH INDEX SURFACE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HIGHER INDEX; HRTEM IMAGES; RECONSTRUCTION; SI(5 5 12); TRANSMISSION ELECTRON MICROSCOPY OBSERVATION; ULTRAHIGH VACUUM HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; UNIT CELLS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035572936 PISSN: 00220744 EISSN: None Source Type: Journal
DOI: 10.1093/jmicro/50.6.541 Document Type: Conference Paper

Times cited : (8)

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