Analytic CRS stack formula for a 2D curved measurement surface and finite-offset reflections

Journal of Seismic Exploration

Volumn 10, Issue 1-3, 2001, Pages 245-262

  Chira Oliva, P ^a   Tygel, M ^a   Zhang, Y ^a   Hubral, P ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

Converted waves; Curved acquisition topography; Imaging; Lateral velocity inhomogeneity; Multi coverage reflection data; Stacking techniques

Indexed keywords

DATA PROCESSING; SEISMIC DATA; STACKING;

EID: 0035569871     PISSN: 09630651     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

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