Secondary electron yield of a thin film coating on the APS RF cavity tuners

Proceedings of the IEEE Particle Accelerator Conference

Volumn 3, Issue , 2001, Pages 2153-2155

  Walters, D R ^a   Ma, Q ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CAVITY RESONATORS; COATING TECHNIQUES; COMPOSITION; ELECTRONS; HEAT TREATMENT; IMPURITIES; MORPHOLOGY; SPUTTERING; STOICHIOMETRY; SUBSTRATES; THIN FILMS; TITANIUM NITRIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

CAVITY TUNERS; SECONDARY ELECTRONS;

ION SOURCES;

EID: 0035569332     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. Coating for the APS RF cavity tuners for the reduction of secondary electrons