Refinement of crystallographic parameters in refractory metal disilicides

Materials Research Society Symposium - Proceedings

Volumn 646, Issue , 2001, Pages

  Tanaka, K ^a   Nawata, K ^a   Inui, H ^a   Yamaguchi, M ^a   Koiwa, M ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; LATTICE CONSTANTS; SCATTERING; SINGLE CRYSTALS; STRUCTURAL ANALYSIS; X RAY DIFFRACTION;

CRYSTALLOGRAPHIC PARAMETERS;

REFRACTORY METALS;

EID: 0035560258     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)