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Materials Research Society Symposium - Proceedings

Volumn 633, Issue , 2001, Pages

Use of multi-walled carbon nanotubes for conductive probe scanning force microscopy (CP-SFM)

(2) Stavens, Kevin B a Andres, Ronald P a

a PURDUE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACRYLICS; ADHESIVES; COATED MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRODEPOSITION; MICROSCOPIC EXAMINATION; TRANSMISSION ELECTRON MICROSCOPY;

SCANNING FORCE MICROSCOPY (SFM);

CARBON NANOTUBES;

EID: 0035560233 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (2)

References (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.