SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 652, Issue , 2001, Pages

Phase-field simulation of domain structure evolution in ferroelectric thin films

(4) Li, Y L a Hu, S Y a Liu, Z K a Chen, L Q a

a PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; COMPUTER SIMULATION; EIGENVALUES AND EIGENFUNCTIONS; FERROELECTRIC MATERIALS; MORPHOLOGY; PHASE TRANSITIONS; TENSILE STRESS; VOLUME FRACTION;

DOMAIN STRUCTURES;

THIN FILMS;

EID: 0035559692 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (5)

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