|
|
|
Volumn 652, Issue , 2001, Pages
|
|
Influences of interface and dislocation behavior on microstructure evolution
[No Author Info available]
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
CRYSTALLOGRAPHY;
EPITAXIAL GROWTH;
FREE ENERGY;
GIBBS FREE ENERGY;
GRAIN GROWTH;
MELTING;
MORPHOLOGY;
POLYCRYSTALLINE MATERIALS;
POLYCRYSTALS;
SINGLE CRYSTALS;
SOLIDIFICATION;
SURFACE TENSION;
THIN FILMS;
CRYSTALLINE SOLIDS;
EIREV;
ELECTRON BACKSCATTER DIFFRACTION (EBSD);
GRAIN BOUNDARY MIGRATION (GBM);
GRAIN BOUNDARY MOBILITY;
INTERFACIAL FREE ENERGY;
MICROSTRUCTURE CONTROL;
PURE MATERIALS;
THERMODYNAMICAL THEORIES;
TRIPLE JUNCTIONS;
GRAIN BOUNDARIES;
|
|
EID: 0035559444
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
|
Times cited : (4)
|
|
References (0)
|