In situ X-ray absorption spectroscopy in the soft energy range: Novel prospects for the chemical characterization of solid state surfaces at high pressure and high temperature

Materials Research Society Symposium - Proceedings

Volumn 678, Issue , 2001, Pages

  Schedel Niedrig, Th ^a   Havecker M ^b   Knop Gericke, A ^b   Reinke, P ^c   Schlogl R ^b   Lux Steiner, M Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^c UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CATALYSIS; ELECTRONIC STRUCTURE; HIGH PRESSURE EFFECTS; HIGH TEMPERATURE EFFECTS; RATE CONSTANTS; SEMICONDUCTING DIAMONDS; SURFACE STRUCTURE; X RAY SPECTROSCOPY;

CHEMICAL CHARACTERIZATION; SURFACE ELECTRONIC STRUCTURE; X-RAY ABSORPTION SPECTROSCOPY;

SURFACE CHEMISTRY;

EID: 0035558730     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-678-ee8.3.1     Document Type: Conference Paper

References (15)

1. In situ Methods in Catalysis
2. Application of copper suboxide for the partial oxidation: In situ and ex situ characterization