Misfit dislocations in epitaxial Ni/Cu bilayer and Cu/Ni/Cu trilayer thin films

Materials Research Society Symposium - Proceedings

Volumn 673, Issue , 2001, Pages

  Yamamoto, Tadashi ^a   Misra, Amit ^a   Hoagland, Richard G ^a   Nastasi, Mike ^a   Kung, Harriet ^a   Hirth, John P ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; COPPER; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MULTILAYERS; NICKEL; STRAIN MEASUREMENT; THICKNESS MEASUREMENT; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CRITICAL THICKNESS; GLIDE DISLOCATIONS; LOMER DISLOCATIONS; STRAIN FIELDS;

DISLOCATIONS (CRYSTALS);

EID: 0035558628     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-673-p7.1     Document Type: Conference Paper

References (17)