Laser light scattering in-situ studies on the growth of chalcopyrite thin films

Materials Research Society Symposium - Proceedings

Volumn 668, Issue , 2001, Pages

  Scheer, R ^a   Pietzker, Ch ^a   Braunig D ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; LASER BEAM EFFECTS; LIGHT SCATTERING; MORPHOLOGY; OPTOELECTRONIC DEVICES; PHASE TRANSITIONS; SUBSTRATES; SURFACE ROUGHNESS; X RAY SPECTROSCOPY;

OPTOELECTRONIC FILMS;

THIN FILMS;

EID: 0035557226     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-668-h7.3     Document Type: Conference Paper

References (10)

1. In-situ investigation of Cu-In-Se reactions by thin film calorimetry
2. Formation of secondary phases in evaporated CuInS2 thin films: A surface analytical study
3. Measurement of the finich of diamond-turned metal surfaces by differential light scattering
4. In-situ, real-time diffuse optical reflectivity measurements during GaAs cleaning and subsequent ZnSe/GaAs heteroepitaxy
5. In-situ detection of InGaAs strained-layer relaxation by laser light scattering
6. Relationship between surface scattering and microtopographic features
7. Surface properties of (1 1 1), (001), and (1 1 0)-oriented epitaxial CuInS2/Si films
8. Heteroepitaxy of CuInS2 on Si(1 1 1)