Deep centers and fill factor losses in the CIGS devices

Materials Research Society Symposium - Proceedings

Volumn 668, Issue , 2001, Pages

  Igalson, M ^a   Kubiaczyk, A ^a   Zabierowski, P ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CAPACITANCE; CHARACTERIZATION; COPPER COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; DOPING (ADDITIVES); ELECTRIC ADMITTANCE; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; INTERFACES (MATERIALS); LIGHTING; SPECTROSCOPIC ANALYSIS;

SPACE CHARGE DISTRIBUTION;

PHOTOVOLTAIC CELLS;

EID: 0035557167     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-668-h9.2     Document Type: Conference Paper

References (12)