Impedance spectroscopy and Hall measurements on CdTe thin polycrystalline films

Materials Research Society Symposium - Proceedings

Volumn 668, Issue , 2001, Pages H5101-H5106

  Gilmore, A S ^a   Kaydanov, V ^a   Ohno, T R ^a   Grecu, D ^a   Rose, D ^a  

^a Department of Geology and Geological Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; CHARGE CARRIERS; GRAIN BOUNDARIES; HALL EFFECT; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DOPING; SPECTROSCOPIC ANALYSIS;

PHOTOGENERATED CARRIERS; POLYCRYSTALLINE FILMS;

THIN FILMS;

EID: 0035556764     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-668-h5.10     Document Type: Article

References (6)

1. Cadmium telluride