High resolution and high sensitivity CMOS panel sensors for X-ray

IEEE Nuclear Science Symposium and Medical Imaging Conference

Volumn 1, Issue , 2001, Pages 29-33

  Mori, Harumichi ^a   Kyuushima, Ryuuji ^a   Fujita, Kazuki ^a   Honda, Masahiko ^a  

^a CENTRAL RESEARCH LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM COMPOUNDS; CMOS INTEGRATED CIRCUITS; IMAGE QUALITY; INTEGRATED CIRCUIT LAYOUT; OPTICAL PROPERTIES; PHOSPHORS; POWER AMPLIFIERS; RADIOGRAPHY; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE; X RAYS;

CMOS PANEL SENSOR; LUMINANCE; MONOCRYSTALLINE SILICON; MONOLITHIC AMPLIFIERS;

IMAGE SENSORS;

EID: 0035553691     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. High resolution, high fill factor a-Si: H sensor arrays for medical imaging
2. Performance of an amorphous silicon flat panel x-ray imaging detector for general radiography
3. Comparison of low contrast detectability between a digital amorphous silicon and a screen-film based imaging system for thoracic adiography
4. Comparison of low contrast detectability between a digital amorphous silicon and a screen-film based imaging system for thoracic adiography
5. Fluoroscopic performance of an amorphous silicon flat-panel x-ray imaging detector
6. New cesium iodine-selenium x-ray detector structure for digital radiography and fluoroscopy
7. Performance evaluation of a large area, 97 μm pindirect detection active matrix flat panel imager (AMFPI) for radiology and fluoroscopy
8. Development and evaluation of a-Se and CdTe flat-panel x-ray detectors for digital radiography and fluo-roscopy