Artifacts in atomic force microscopy

Mikroelektronika

Volumn 30, Issue 4, 2001, Pages 257-266

  Gajnutdinov, R V ^a   Arutyunov, P A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035550884     PISSN: 05441269     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)