A windows program for the analysis of tectonic strain using deformed elliptical markers

Computers and Geosciences

Volumn 27, Issue 10, 2001, Pages 1251-1255

  Mulchrone, Kieran F ^a   Meere, Patrick A ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSE; SOFTWARE; STRAIN MEASUREMENT; TECTONICS;

EID: 0035546511     PISSN: 00983004     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0098-3004(01)00025-5     Document Type: Article

References (10)

1. A study of a granite/granite gneiss transition and accompanying schistosity formation in SE Spain
2. Analysis of strained sedimentary fabrics: Review and test
3. A technique of finite strain analysis using elliptical particles
4. Estimation of the tectonic strain ratio from the mean shape of deformed elliptical markers
5. Clastic grain shape and orientation in relation to cleavage from the Aberystwyth Grits, Wales
6. A Fortran IV program for the analysis of tectonic strain using deformed elliptical markers
7. Determination of geologic strain using randomly oriented strain markers of any shape
8. f/φ method