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Volumn 33, Issue 14, 2001, Pages 1091-1109

Motif analysis for automatic segmentation of CT surface contours into individual surface features

Author keywords

CT scanning; Feature extraction; Motif analysis; Reverse engineering; Segmentation

Indexed keywords

ALGORITHMS; COMPUTERIZED TOMOGRAPHY; CONTOUR MEASUREMENT; FEATURE EXTRACTION; REVERSE ENGINEERING; SPURIOUS SIGNAL NOISE;

EID: 0035546396     PISSN: 00104485     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-4485(00)00145-7     Document Type: Article
Times cited : (11)

References (22)
  • 12
    • 0023157869 scopus 로고
    • Comparison of motif combination with mean line and envelope systems used for surface profile analysis
    • (1987) Wear , vol.117 , pp. 335-345
    • Shunmugam, M.1
  • 13
    • 0020331253 scopus 로고
    • Motif combination
    • (1982) Wear , vol.83 , pp. 165-179
    • Fahl, D.1
  • 20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.