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Volumn 33, Issue 14, 2001, Pages 1091-1109
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Motif analysis for automatic segmentation of CT surface contours into individual surface features
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Author keywords
CT scanning; Feature extraction; Motif analysis; Reverse engineering; Segmentation
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Indexed keywords
ALGORITHMS;
COMPUTERIZED TOMOGRAPHY;
CONTOUR MEASUREMENT;
FEATURE EXTRACTION;
REVERSE ENGINEERING;
SPURIOUS SIGNAL NOISE;
MOTIF ANALYSIS;
IMAGE SEGMENTATION;
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EID: 0035546396
PISSN: 00104485
EISSN: None
Source Type: Journal
DOI: 10.1016/S0010-4485(00)00145-7 Document Type: Article |
Times cited : (11)
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References (22)
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