A comparison of Rutherford backscattering spectroscopy and X-ray diffraction to determine the composition of thick InGaN epilayers

Physica Status Solidi (B) Basic Research

Volumn 228, Issue 1, 2001, Pages 41-44

  Srinivasan, S ^a   Liu, R ^a   Bertram, F ^a   Ponce, F A ^a   Tanaka, S ^b   Omiya, H ^b   Nakagawa, Y ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b NICHIA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035541046     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200111)228:1<41::AID-PSSB41>3.0.CO;2-N     Document Type: Article

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