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Volumn 39, Issue 7, 2001, Pages 455-460
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Temperature and frequency dependent dielectric constant/loss studies in 50 MeV Si+ ion irradiated kapton-H film
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035539096
PISSN: 00195596
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (12)
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References (22)
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