Nano-scale analytical characterization of engineering materials by transmission electron microscopy

Advanced Engineering Materials

Volumn 3, Issue 8, 2001, Pages 612-615

  Epicier, Thierry ^a   Cheynet, Marie Claude ^b   Martin, Jean Michel ^c  

^a UNIVERSITÉ DE LYON   (France)

^b UNIV GRENOBLE ALPES   (France)

^c LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035536425     PISSN: 14381656     EISSN: None     Source Type: Journal    
DOI: 10.1002/1527-2648(200108)3:8<612::AID-ADEM612>3.0.CO;2-1     Document Type: Article

References (12)

1. For details concerning EDX in TEM, see for example D. B. Williams, C. B. Carter, Transmission Electron Microscopy - IV: Spectrometry, Plenum, New York 1996, p. 729.
2. For details concerning EELS, see for example R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd ed., Plenum, New York, 1996, p. 485.
3. L. Gremillard, T. Epicier, J. Chevalier, G. Fantozzi, Acta Metall Mater. 2000, 48, 4647.
4. D. R. Clarke, J. Am. Ceram. Soc. 1996, 70, 15.
5. D. A. Porter, J. W. Edington, Proc. R. Soc. London A 1977, 358, 335.
6. J. W. Cahn, Acta Metall. 1959, 7, 18.
7. M. Hillert, Metall. Trans. 1972, 3, 2729.
8. A. Bogel, W. Gust, Z. Metallkd. 1988, 79, 296.
9. D. I. Potter, J. Less-Common Met. 1973, 31, 299.
10. D. Duly, M. C. Cheynet, Y. Brechet, Acta Metall. Mater. 1994, 42, 3843.
11. D. Duly, M. C. Cheynet, Y. Brechet, Acta Metall. Mater. 1994, 42, 3855.
12. J. L. Lavergne, J. M. Martin, M. Belin, Microsc. Microanal. Microstruct. 1992, 3, 517.