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Volumn 225, Issue 2, 2001, Pages 343-352

Localized states in arbitrarily shaped quantum wire: A variation-perturbation technique

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EID: 0035534355     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200106)225:2<343::AID-PSSB343>3.0.CO;2-V     Document Type: Article
Times cited : (7)

References (18)
  • 1
    • 0004140205 scopus 로고    scopus 로고
    • London
    • L. T. CANHAM (Ed.), Properties of Porous Silicon, INSPEC, London 1997. G. AMATO, C. DELERUE, and H.-J, VON BARDELEBEN, Structural and Optical Properties of Porous Silicon Nanostructures, Gordon & Breach, Amsterdam 1997.
    • (1997) Properties of Porous Silicon, INSPEC
    • Canham, L.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.