Data driven versions of Neyman's test for uniformity based on Bayesian rule

Journal of Statistical Computation and Simulation

Volumn 68, Issue 3, 2001, Pages 203-222

  Bogdan, Ma̢gorzata ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Exponential family; Goodness of fit test; Monte Carlo simulations; Neyman's test; Schwarz BIC criterion; Smooth test

Indexed keywords

EID: 0035532281     PISSN: 00949655     EISSN: None     Source Type: Journal    
DOI: 10.1080/00949650108812067     Document Type: Article

References (27)

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