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Volumn 46, Issue 4, 2001, Pages 490-491
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Anomalous behavior of arsenic ions implanted into silicon at 85o°C
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035531396
PISSN: 10637842
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1365477 Document Type: Article |
Times cited : (3)
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References (5)
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