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Volumn 223, Issue 2, 2001, Pages 567-572
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Quantifying the effect of indirect carrier leakage on visible Al(GaInP) lasers using high pressures and low temperatures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035530608
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(200101)223:2<567::AID-PSSB567>3.0.CO;2-6 Document Type: Article |
Times cited : (24)
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References (8)
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