Computer Simulations of Diffraction Effects due to Stacking Faults in β-SiC: II, Experimental Verification

Journal of the American Ceramic Society

Volumn 84, Issue 11, 2001, Pages 2645-2651

  Pujar, Vijay V ^a,b   Cawley, James D ^a  

^a Case Western Reserve University   (United States)

^b GOODRICH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; HIGH RESOLUTION ELECTRON MICROSCOPY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

STACKING ERROR DISTRIBUTION; STACKING ERROR POPULATION;

SILICON CARBIDE;

EID: 0035526575     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb01066.x     Document Type: Article

References (15)

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