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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 6, 2001, Pages 2284-2288

Structure analysis of Ba2In2O5 and related compounds by electron microscopy

(4) Mitome, M a Okamoto, M a Bando, Y a Yamamura, H b

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b KANAGAWA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCINATION; COMMINUTION; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; LATTICE CONSTANTS; NUMERICAL ANALYSIS; PEROVSKITE; SINTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BARIUM INDIUM OXIDE; CUBIC PEROVSKITE STRUCTURE; ORTHORHOMBIC BROWNMILLERITE STRUCTURE;

BARIUM COMPOUNDS;

EID: 0035519816 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1421566 Document Type: Article

Times cited : (18)

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