Far-end crosstalk reduction in double-layered dielectric interconnects

IEEE Transactions on Electromagnetic Compatibility

Volumn 43, Issue 4, 2001, Pages 566-572

  Gazizov, Talgat R ^a,b  

^a IEEE   (Russian Federation)

^b TOMSK STATE UNIVERSITY OF CONTROL SYSTEMS AND RADIOELECTRONICS   (Russian Federation)

Author keywords

Coupled interconnects; Double layered dielectric; Far end crosstalk

Indexed keywords

DIELECTRIC INTERCONNECTS;

COMPUTER SIMULATION; COUPLED CIRCUITS; CROSSTALK; DIELECTRIC LOSSES; DIELECTRIC MATERIALS; ELECTROMAGNETIC DISPERSION; MATHEMATICAL MODELS; MICROSTRIP LINES; PERMITTIVITY; PRINTED CIRCUIT BOARDS; SUBSTRATES;

INTERCONNECTION NETWORKS;

EID: 0035519748     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.974636     Document Type: Article

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