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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 6, 2001, Pages 2258-2261

Scanning probe microscopy of domains and domain walls in sol-gel PbTiO3 thin films

(4) Chen, Xiaofeng a Zhu, Weiguang a Liu, Weiguo a Wang, Zhihong a

a NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLIZATION; CRYSTALLOGRAPHY; FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; PHASE TRANSITIONS; PYROLYSIS; REMANENCE; THICKNESS MEASUREMENT; VIBRATIONS (MECHANICAL);

DOMAIN WALLS; FERROELECTRIC DOMAIN IMAGING; LEAD TITANATE THIN FILMS; PIEZOVIBRATION; SCANNING PROBE MICROSCOPY;

LEAD COMPOUNDS;

EID: 0035519440 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1421569 Document Type: Article

Times cited : (4)

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