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Volumn 42, Issue 11, 2001, Pages 2307-2315
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Prediction of microstructural evolution during grain growth of a pure aluminum by means of Monte Carlo simulation
a
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Author keywords
Aluminum; Grain growth; Grain boundary energy; Grain boundary mobility; Monte Carlo simulation; Scanning electron microscopy electron backscatter diffraction pattern analysis
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Indexed keywords
ANNEALING;
COMPUTER SIMULATION;
GRAIN BOUNDARIES;
GRAIN GROWTH;
MICROSTRUCTURE;
MONTE CARLO METHODS;
SCANNING ELECTRON MICROSCOPY;
ELECTRON BACKSCATTER DIFFRACTION PATTERNS (EBSP);
ALUMINUM;
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EID: 0035519385
PISSN: 13459678
EISSN: None
Source Type: Journal
DOI: 10.2320/matertrans.42.2307 Document Type: Article |
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Times cited : (13)
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References (23)
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