Laser beam deflectometry based on a subpixel resolution algorithm

Optical Engineering

Volumn 40, Issue 11, 2001, Pages 2517-2523

  Canabal, Héctor ^a   Alonso, José ^a   Bernabeu, Eusebio ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Deflectometry; Experimental ray tracing; Position sensing; Subpixel

Indexed keywords

ALGORITHMS; CAMERAS; CHARGE COUPLED DEVICES; COMPUTATIONAL METHODS; FAST FOURIER TRANSFORMS; OPTICAL INSTRUMENT LENSES; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; SCANNING;

LASER BEAM DEFLECTOMETRY;

LASER BEAM EFFECTS;

EID: 0035519375     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1409939     Document Type: Article

References (16)

1. Moiré deflectometry-ray tracing interferometry
2. Geometrical parameters in the Hartmann test of aspherical mirrors
3. Ronchi test with a square grid
4. Traps in displaying optical performances of a progressive-addition lens
5. Testing optics by experimental ray tracing with a lateral effect photodiode
6. A generalization of the Prentice's law for lenses with arbitrary refracting surfaces
7. A survey of current solid state strat tracker technology
8. Marking parts to ad robot vision
9. Real time image metrology with CCD cameras
10. Optical tracing using charge-coupled devices
11. Effects of window size and shape on accuracy of sub-pixel centroid estimation of target images
12. Subpixel accurracy location estimation from digital signals
13. Improved phase-shifting method for automatic processing of moiré deflectograms