|
Volumn 17, Issue 6, 2001, Pages
|
Editorial: Research industrial statistics-Part I
a
a
NONE
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BAYESIAN METHODS;
INDUSTRIAL STATISTICS;
INTEGRAL CONTROL;
SHEWHART CONTROL CHART;
STATISTICAL QUALITY CONTROL;
STOCHASTIC CALCULUS;
EXPERT SYSTEMS;
INFORMATION TECHNOLOGY;
KNOWLEDGE BASED SYSTEMS;
MATHEMATICAL MODELS;
PARAMETER ESTIMATION;
PROCESS CONTROL;
RANDOM PROCESSES;
STATISTICAL METHODS;
TWO TERM CONTROL SYSTEMS;
QUALITY CONTROL;
|
EID: 0035518461
PISSN: 07488017
EISSN: None
Source Type: Journal
DOI: 10.1002/qre.449 Document Type: Editorial |
Times cited : (6)
|
References (0)
|