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Volumn 11, Issue 8, 2001, Pages

Reliability of resistance/deformation during electrically-driven thermal cycles under stress on Ni25Ti50Cu25 melt spun ribbons

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RESISTANCE; MELT SPINNING; PLASTIC DEFORMATION; SHAPE MEMORY EFFECT; STRESS ANALYSIS; THERMAL CYCLING;

EID: 0035517773     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2001857     Document Type: Conference Paper
Times cited : (1)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.