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Volumn 19, Issue 6, 2001, Pages 2889-2892
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Steady-state direct-current plasma immersion ion implantation using a multipolar magnetic field electron cyclotron resonance plasma source
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRON CYCLOTRON RESONANCE;
HYDROGEN;
MAGNETIC FIELD EFFECTS;
PLASMA SHEATHS;
PLASMA SOURCES;
SECONDARY ION MASS SPECTROMETRY;
SILICON ON INSULATOR TECHNOLOGY;
SILICON WAFERS;
HYDROGEN FORWARD SCATTERING;
PLASMA IMMERSION ION IMPLANTATION (PIII);
ION IMPLANTATION;
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EID: 0035507912
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1412653 Document Type: Article |
Times cited : (4)
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References (17)
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