Shear-force distance control at megahertz frequencies for near-field scanning optical microscopy

Review of Scientific Instruments

Volumn 72, Issue 11, 2001, Pages 4178-

  Simon, A ^a   Brunner, R ^a   White, J O ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035504793     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1406922     Document Type: Article

References (0)