Spectral responsivity uncertainty of silicon photodiodes due to calibration spectral bandwidth

Measurement Science and Technology

Volumn 12, Issue 11, 2001, Pages 1926-1931

  Campos, Joaquín ^a   Corróns, Antonio ^a   Pons, Alicia ^a   Corredera, Pedro ^a   Fontecha, José Luis ^a   Jiménez, José R ^b  

^a Consejo Superior de Investigaciones Científicas   (Spain)

^b UNIVERSITY OF GRANADA   (Spain)

Author keywords

Silicon photodiodes; Spectral bandwidth effect; Spectral radiometric calibration; Spectral responsivity

Indexed keywords

BANDWIDTH; ERROR CORRECTION; INSTRUMENT ERRORS; PHOTODIODES; SPECTRUM ANALYSIS;

SPECTRAL BAND WIDTH;

SEMICONDUCTING SILICON;

CALIBRATION;

EID: 0035504270     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/12/11/323     Document Type: Article

References (13)

1. Detector spectral response from 350 to 1200 nm using a monochromator based spectral comparator
2. Measurement of spectral responsivity of photodetectors
3. Broadband radiometry with spectrally selective detectors
4. Absolute spectral irradiance scale in the 700-2400 nm spectral range
5. Monochromator-based cryogenic radiometry at the NRC
6. Comparison of filter radiometer spectral responsivity with the NIST spectral-irradiance and illuminance scales
7. Comparison of monochromator-based and laser-based cryogenic radiometry
8. A 400 nm to 2500 nm absolute spectral radiance comparison using filter radiometers
9. Evaluation of uncertainties in fundamental radiometric measurements
10. Spectral reflectance of silicon photodiodes
11. Reflectance dependences of silicon trap detectors
12. Silicon photodiode device with 100% external quantum efficiency
13. BIPM international comparison on spectral responsivity