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Volumn 9, Issue 11, 2001, Pages 16-17

Mapping hardness covers new ground

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROTHERMOMECHANICAL TESTS; GRADED COMPOSITIONS; MAPPING INDENTATION SYSTEMS; SCANNING INDENTATION MECHANICAL MICROPROBE;

EID: 0035504119     PISSN: 09678638     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.