The direct interference intensity phase analyzing technique for in situ Michelson interference and its application in studying of the fluctuation of crystal growth rates

Journal of Crystal Growth

Volumn 233, Issue 1-2, 2001, Pages 336-342

  Li, Chaorong ^a,b   Tsukamoto, K ^c  

^a INSTITUTE OF PHYSICS   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

A1. surfaces; A2. growth from solutions

Indexed keywords

BARIUM COMPOUNDS; IMAGE ANALYSIS; SOLUTIONS; THICKNESS MEASUREMENT; WAVE INTERFERENCE;

INTERFERENCE INTENSITY VARIATION; MICHELSON INFERENCE IMAGE;

CRYSTAL GROWTH;

EID: 0035502104     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01580-9     Document Type: Article

References (15)