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Volumn 491, Issue 3, 2001, Pages 370-387

Direct observation of hydration of TiO2 on Ti using electrochemical AFM: Freely corroding versus potentiostatically held

(3) Bearinger, Jane P a,b Orme, Christine A b Gilbert, Jeremy L c

a Northwestern University (United States)

b LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

c SYRACUSE UNIVERSITY (United States)

Author keywords

Amorphous surfaces; Amorphous thin films; Atomic force microscopy; Corrosion; Electrochemical methods; Solid liquid interfaces; Surface structure, morphology, roughness, and topography; Titanium; Titanium oxide

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELECTRIC IMPEDANCE; ELECTROCHEMISTRY; ELECTROLYTIC POLISHING; ETCHING; FILM GROWTH; HYDRATION; INTERFACES (MATERIALS); POLARIZATION; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; SURFACE STRUCTURE;

INTERFACIAL CAPACITANCE;

TITANIUM OXIDES;

EID: 0035501394 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01300-0 Document Type: Article

Times cited : (53)

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